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RAP opportunity at National Institute of Standards and Technology     NIST

Polymer Thin Film Structure and Composition

Location

Material Measurement Laboratory, Materials Science and Engineering Division

opportunity location
50.64.21.C0073 Gaithersburg, MD

NIST only participates in the February and August reviews.

Advisers

name email phone
Christopher L. Soles christopher.soles@nist.gov 301.975.8087
Daniel Sunday daniel.sunday@nist.gov 301-975-4921

Description

Polymer thin films are key functional components for advanced manufacturing and separations technologies. Improvements in the properties of polymer thin films can assist in the development of new lithographic approaches, improved membrane efficiency, or lower detection limits for sensors. Final control over the properties can be achieved by variation in either structure or chemistry and can often depend on variations near interfaces. Understanding structure-property relationships in these systems requires the development of new characterization approaches given the limited sample volumes. Research projects include the study of block copolymers and polymer blends, characterization of chemical reactions in thin films, development of soft X-ray scattering and reflectivity methods, and the integration of scattering measurements with simulations.

 

References

Daniel F. Sunday, Moshe Dolejsi, Alice B. Chang, Lee J. Richter, Ruipeng Li, R. Joseph Kline, Paul F. Nealey, Robert H. Grubbs. “Confinement and Processing Can Alter the Morphology and Periodicity of Bottlebrush Block Copolymers in Thin Films” ACS Nano, 14(12), 17476-17486, 2020

Daniel F. Sunday, Xuanxuan Chen, Thomas R. Albrecht, Derek Nowak, Paulina Rincon Delgadillo, Takahiro Dazai, Ken Miyagi, Takaya Maehashi, Akiyoshi Yamazaki, Paul F. Nealey, R. Joseph Kline. “Influence of Additives on the Interfacial Width and Line Edge Roughness in Block Copolymer Lithography. Chemistry of Materials, 32(6), 2399-2407, 2020

Thomas J Ferron, Jacob L Thelen, Kushal Bagchi, Chuting Deng, Eliot Gann, Juan J de Pablo, MD Ediger, Daniel F Sunday, Dean M DeLongchamp. “Characterizing of the Interfacial Orientation and Molecular Conformation in a Glass-Forming Organic Semiconductor”. ACS Applied Materials and Interfaces. 14(2), 3455-3466, 2022

 

key words
Polymer; Scattering; Reflectivity; X ray; Soft X ray; Block copolymer; Thin film; Nanostructure;

Eligibility

Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants

Stipend

Base Stipend Travel Allotment Supplementation
$82,764.00 $3,000.00
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