Opportunity at National Institute of Standards and Technology NIST
Nano- and Atomic-Resolution Electron Microscopy of Three-Dimensional Structures
Location
Material Measurement Laboratory, Materials Measurement Science Division
| opportunity |
location |
|
| 50.64.31.B7958 |
Gaithersburg, MD |
Please note: This Agency only participates in the February and August reviews.
Advisers
| name |
email |
phone |
|
| Andrew Anthony Herzing |
andrew.herzing@nist.gov |
301.975.2860 |
Description
The modern transmission electron microscope (TEM) is capable of atomic-resolution structural and chemical imaging. However, such data typically only represents a two-dimensional (2-D) projection of the underlying physical or chemical structure. To characterize the three-dimensional (3-D) makeup of a specimen, electron tomography is often employed. This involves the computational determination of 3-D features of a specimen from a series of their 2-D projections. By carefully preparing the specimen, designing the experimental acquisition, and subsequent data processing, semi- and fully-quantitative 3-D characterization should be possible. The successful candidate should possess a strong foundation in TEM characterization. Experience with aberration-corrected electron optics and/or tomographic reconstruction techniques would be ideal, but not a prerequisite.
References
Herzing AA, Richter LJ, Anderson IM: Journal of Physical Chemistry C 114: 17501, 2010
Scott MC, et al: Nature 483: 444, 2012
Keywords:
Electron microscopy; TEM; STEM; Tomography; Nanotechnology; Nanocharacterization; EELS; EDS; HAADF;
Eligibility
Citizenship:
Open to U.S. citizens
Level:
Open to Postdoctoral applicants
Stipend
| Base Stipend |
Travel Allotment |
Supplementation |
|
| $74,950.00 |
$3,000.00 |
|
|