Opportunity at National Institute of Standards and Technology NIST
Depth Profiling Using Neutron Beams
Material Measurement Laboratory, Chemical Sciences Division
Please note: This Agency only participates in the February and August reviews.
|Pamela M. Chu
|Jamie Lynn Weaver
|Christopher Douglas Zangmeister
Measurement of prompt charged particle radiation from nuclear reactions is a powerful tool for elemental analysis and compositional mapping of the first few micrometers from a material surface. Neutron depth profiling (NDP) employs a cold-neutron beam from the NIST neutron source to nondestructively measure the depth distribution of nuclides of helium, lithium, boron, nitrogen, oxygen, sodium, and a few additional elements that emit charged particles upon neutron capture. Research topics include method development, focusing on improved specificity, accuracy, sensitivity, and spatial resolution through detailed studies of the interaction of neutrons and their products with samples and detectors. A few examples of technologies being explored include lithium ion battery performance, oxidation growth, man-made diamonds, magnetic thin films, and reactor wall survival.
Charged particles; Chemical profiling; Compositional mapping; Focused neutrons; Materials analysis; Neutron beams; Semiconductors; Lithium batteries; Non-destructive analysis;
Open to U.S. citizens
Open to Postdoctoral applicants