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Opportunity at National Institute of Standards and Technology (NIST)

Localization Microscopy


Physical Measurement Laboratory, Microsystems and Nanotechnology Division

RO# Location
50.68.02.B7509 Gaithersburg, MD 20899

Please note: This Agency only participates in the February and August reviews.


name email phone
Samuel M. Stavis 301-975-2844



Localization microscopy has left the resolution limit in the rearview optics. However, most localization measurements are precise but inaccurate, leading to overconfidence in position data. This fundamental issue is becoming more important as localization microscopy matures, requiring not only novel methods but also reliable quantities for meaningful comparison. We lead the development of innovative standards and novel calibrations to achieve accuracy in localization microscopy [1, 2], with applications ranging from nanoplastic characterization to nanophotonic integration. Our project is collaborative and interdisciplinary, and we seek outstanding applicants with high motivation and strong backgrounds in the physical sciences.


Thank you for your interest in this research opportunity. For more information, please email


[1] Accurate localization microscopy by intrinsic aberration calibration, C. R. Copeland, C. D. McGray, B. Robert Ilic, J. Geist, and S. M. Stavis, Nature Communications 12, 3925 (2021).

[2] Subnanometer localization accuracy in widefield optical microscopy, C. R. Copeland, J. Geist, C. D. McGray, V. A. Aksyuk, J. A. Liddle, B. R. Ilic, and S. M. Stavis, Light: Science & Applications 7, 31 (2018).

Accuracy; Calibration; Correlative; Localization; Microscopy; Optical; Precision; Standard; Tracking


Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants


Base Stipend Travel Allotment Supplementation
$74,950.00 $3,000.00
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