Opportunity at National Institute of Standards and Technology (NIST)
Power Electronics Performance and Reliability
Physical Measurement Laboratory, Nanoscale Device Characterization Division
||Gaithersburg, MD 20899
Please note: This Agency only participates in the February and August reviews.
|Kin P. Cheung
Wide bandgap power device is poised to transform the energy landscape of the United States. However, reliability concern remains a key hurdle. In many power applications, failure is not an option. How can we assure that high reliability is achieved? This is a very hard problem in need of a solution. We focus on the physics of reliability and develop physics based electrical measurement methods that the industry can use and their customer can trust.
Power device; Defect; Wide bandgap; SiC; GaN; Ga2O3; Electrical characterization; Reliability
Open to U.S. citizens
Open to Postdoctoral applicants