Opportunity at National Institute of Standards and Technology NIST
Single Electron Devices for Quantum Information and Metrology in Silicon
Physical Measurement Laboratory, Nanoscale Device Characterization Division
||Gaithersburg, MD 20899
Please note: This Agency only participates in the February and August reviews.
|Michael David Stewart
Silicon-based single electron devices (SED) allow control and measurement of both the spin and charge degrees of freedom for individual electrons. This control imbues SEDs with a wide array of applications, including quantum information (QI) and electrical current standards. We are working to build viable qubits in silicon and an electrical current standard necessary for the redefinition of the SI by focusing on understanding the fundamental limitations of quantum mechanical control and manipulation. Our strategy is to explore these limitations through high-frequency, low-temperature coherent measurements, charge pumping measurements, and standard defect measurements in both quantum dot-based devices and atomically precise single-atom devices in silicon.
Quantum information; Quantum computing; Quantum measurement; Redefinition of SI; Current standard; Quantum dot; Single-atom device; Single electron device;
Open to U.S. citizens
Open to Postdoctoral applicants