Measurements that define the electrical properties of materials such as metals, foils, metallic paints, glass coatings, and silicon wafers are of increasing importance for silicon photovoltaic processing. Research opportunities exist to provide electrical measurements on many of these materials that are accurate and SI traceable to national standards of resistance. Eddy current, three-point probe, four-point probe, and guarded disks are several of the techniques used to make resistivity measurements. Research opportunities to address the growing interests in resistivity and conductivity measurement of metals, ceramics, and semiconductors exist at NIST in the Metrology of the Ohm project.

 

key words

Solar energy; Solar cell materials; Conducting films; Electrical measurements; Conductivity; Sheet resistance; Volume resistivity; Resistance standards;

Citizenship:  Open to U.S. citizens

Level:  Open to Postdoctoral applicants