Opportunity at National Institute of Standards and Technology (NIST)
Physical Measurement Laboratory, Applied Physics Division
Please note: This Agency only participates in the February and August reviews.
|Stephen E Russek
The goal of this project is to develop nano-electromagnetic imaging using scanning microwave, NV center, and magnetic resonance microscopy to characterize 2D materials, semiconductor devices, and biological materials from DC to the THz regime. The measurements enable the engineering of dielectric, magnetic and electrical transport properties of thin film materials and metamaterials based on patterned arrays of material elements. Such patterning allows lithographic control of the permittivity, permeability, and conductivity of nanoscale materials and can provide new functionalities. Examples of such materials include 2D semiconductor and magnetic materials, light- and field-tunable materials, low loss amorphous/nanoparticle composites, MRI contrast agents, and active neural cells. The developed metrology is based on state-of-the-art broadband AFM near field imaging systems with modifications allowing nanoscale measurement and control of electromagnetic properties.
1. Berweger S, Tyrell-Ead R, Chang H, Wu M, Zhu N, Tang HX, Nembach H, Karl Stupic T, Russek S, Mitch Wallis T, Kabos P. Imaging of magnetic excitations in nanostructures with near-field microwave microscopy. Journal of Magnetism and Magnetic Materials. 2022;546:168870. doi: https://doi.org/10.1016/j.jmmm.2021.168870.
Ferroelectric; Ferromagnetic; Frequency-tunable materials; High frequency; Metamaterials; Microwave materials; Photonic bandgap; Magnetic resonance; biomagnetic imaging
Open to U.S. citizens
Open to Postdoctoral applicants