Opportunity at National Institute of Standards and Technology NIST
Statistical Learning in Functional Data and 3d Imaging
Information Technology Laboratory, Statistical Engineering Division
Please note: This Agency only participates in the February and August reviews.
|ZQ John Lu
This project provides research opportunities to develop statistical methodology or computer software to address increasing needs at NIST on using machine learning to solve interesting engineering applications or physical measurement problems. Modern measuring devices often produce data in the form of spectra or 3d images (such as hyperspectral images and OCT), the goal is to provide statistical methodology for measurements and uncertainty analysis based on such high throughput data. Functional data analysis in designed experiments settings is often encountered in standard developments. Both supervised learning and unsupervised learning including singular value decomposition to extract spectral signatures are important and are our current interests.
Data science; sensors; image diagnosis; classification and prediction.
Open to U.S. citizens
Open to Postdoctoral applicants