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Opportunity at National Institute of Standards and Technology   NIST

Statistical Learning in Functional Data and 3d Imaging

Location

Information Technology Laboratory, Statistical Engineering Division

opportunity location
50.77.61.C0230 Gaithersburg, MD

Please note: This Agency only participates in the February and August reviews.

Advisers

name email phone
ZQ John Lu john.lu@nist.gov 301.975.3208

Description

This project provides research opportunities  to develop statistical methodology or computer software to address increasing needs at NIST on using machine learning to solve interesting engineering applications or physical measurement problems. Modern measuring devices often produce data in the form of spectra or 3d images (such as hyperspectral images and OCT),  the goal is to provide statistical methodology for measurements and uncertainty analysis based on such high throughput data. Functional data analysis in designed experiments settings is often encountered in standard developments. Both supervised learning and unsupervised learning including  singular value decomposition to extract spectral signatures are important  and are our current interests.  

References: 

https://nvlpubs.nist.gov/nistpubs/SpecialPublications/NIST.SP.260-228.pdf

https://doi.org/10.1557/s43578-021-00362-8

key words
Data science; sensors; image diagnosis; classification and prediction.

Eligibility

Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants

Stipend

Base Stipend Travel Allotment Supplementation
$82,764.00 $3,000.00
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