Knowledge of the chemical composition and the physical characterization of submicroscopic structures and particles is critical to various new technologies. Many of these technologies manufacture and/or utilize complex structures including multiplayer films individual particles with dimensions of micrometers down to approximately 10 nanometers. This project focuses on developing analytical methods and standards for the chemical and physical characterization of structures, multilayer films, and particles in this size regime. The primary techniques include high-, medium-, and low-voltage electron microscopies, as well as microbeam mass spectrometry. Procedures are being developed for (1) elemental analysis of these structures with energy- and wavelength-dispersive x-ray spectrometry, (2) crystallographic characterization by electron diffraction techniques including EBSD, (3) elemental and chemical analysis by Auger electron and electron energy loss spectrometry, and (4) isotopic and elemental analysis of particles by secondary ion and laser microprobe mass spectrometry. The project will also include the development of computer automated characterization using the different analytical signals from the various instruments.

 

key words

Electron microscopy; Molecular spectra; Nanoscale analysis; Submicrometer particles;

Citizenship:  Open to U.S. citizens

Level:  Open to Postdoctoral applicants