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RAP opportunity at National Institute of Standards and Technology     NIST

Localization Microscopy

Location

Physical Measurement Laboratory, Microsystems and Nanotechnology Division

opportunity location
50.68.02.B7509 Gaithersburg, MD 20899

NIST only participates in the February and August reviews.

Advisers

name email phone
Samuel M. Stavis samuel.stavis@nist.gov 301-975-2844

Description

Summary:

Localization microscopy has left the resolution limit in the rearview optics. However, most localization measurements are precise but inaccurate, leading to overconfidence in position data. This fundamental issue is becoming more important as localization microscopy matures, requiring not only novel methods but also reliable quantities for meaningful comparison. We lead the development of innovative standards and novel calibrations to achieve accuracy in localization microscopy [1, 2], with applications ranging from nanoplastic characterization to nanophotonic integration. Our project is collaborative and interdisciplinary, and we seek outstanding applicants with high motivation and strong backgrounds in the physical sciences.

Contact:

Thank you for your interest in this research opportunity. For more information, please email samuel.stavis@nist.gov.

References:

[1] Accurate localization microscopy by intrinsic aberration calibration, C. R. Copeland, C. D. McGray, B. Robert Ilic, J. Geist, and S. M. Stavis, Nature Communications 12, 3925 (2021).

[2] Subnanometer localization accuracy in widefield optical microscopy, C. R. Copeland, J. Geist, C. D. McGray, V. A. Aksyuk, J. A. Liddle, B. R. Ilic, and S. M. Stavis, Light: Science & Applications 7, 31 (2018).

key words
Accuracy; Calibration; Correlative; Localization; Microscopy; Optical; Precision; Standard; Tracking

Eligibility

Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants

Stipend

Base Stipend Travel Allotment Supplementation
$82,764.00 $3,000.00
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