We are investigating a variety of nanoscale materials systems for use in photonic quantum information systems. Examples of materials of current interest include III-V semiconductors (InAs quantum dots, ErAs nanoparticles) and superconductors (WSi, MoSi, NbTiN) for single-photon detectors, all of which are developed at NIST. In addition to device processing and electrical and optical characterization, we are interested in atomic-scale characterization with (scanning) transmission electron microscopy (STEM/TEM). An aberration corrected scanning transmission electron microscope is available with a variety of detectors (HAADF, BF, ABF, XEDS, EELS) as well as holography and tomography capability. Experience in STEM/TEM imaging and microanalysis is preferred.