Research opportunities are available to advance the measurement of properties of materials from the terahertz to extreme ultraviolet for applications in remote sensing, nanoscale science, microelectronics, photonics, color and appearance, medical imaging, homeland security, and defense. State-of-the-art research instruments are available for accurate measurement of such optical properties as reflectance, transmittance, scattering, emittance, and fluorescence in a variety of geometries using laser, lamp, and blackbody radiation sources. Specialized capabilities exist for light scattering ellipsometry, index of refraction, optical grating scatterometry, bidirectional optical scattering and reflectometry, polarimetry, spectroscopy, emissometry, and retroreflectometry. We are interested in efforts that develop new or improved measurement capabilities, standards, or applications.

For more information, see https://www.nist.gov/pml/sensor-science/optical-properties-materials

key words

Reflectance; Transmittance; Spectroscopy; Optical scattering; Refractive index; Scatterometry; Fluorescence; Absorptance; Emittance; Emissivity; THz; Ellipsometry; BRDF; Polarimetry; Reflectometry; Photonics; Imaging; Refraction; Color; Appearance; Diffuse; Blackbody; Bidirectional; Spectrophotometer; Retroreflection; Terahertz; Infrared; Ultraviolet; Birefringence

Citizenship:  Open to U.S. citizens

Level:  Open to Postdoctoral applicants