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RAP opportunity at National Institute of Standards and Technology     NIST

Microscopic and Spectroscopic Characterization in Engineered Polymeric Materials

Location

Engineering Laboratory, Materials and Structural Systems Division

opportunity location
50.73.11.B8426 Gaithersburg, MD

NIST only participates in the February and August reviews.

Advisers

name email phone
Xiaohong Gu xiaohong.gu@nist.gov 301.975.6523
Li-Piin Sung lipiin@nist.gov 301.975.6737

Description

The purpose of this research is to develop advanced characterization techniques for physical and chemical properties in the complex engineered polymeric systems during their service lives in energy, infrastructure, and other applications. Both microscopic (atomic force microscopy, electric force microscopy, laser scanning confocal microscopy and scanning electron microscopy) and spectroscopic (infrared microscope, Raman microscope, fluorescence microscope, ultra-violet visible spectroscopy, x-ray photoelectron spectroscopy) tools and other relevant techniques are explored. We will focus on the microstructural changes and chemical degradation on surface, individual layers, or interfaces in multilayer systems containing polymers. Recent work includes characterization of failure mode and degradation mechanism of polymeric encapsulation materials in photovoltaic modules, light-emitting diode, and other energy-related areas.

 

Reference

Lin CC, Krommenhoek PJ, Watson SS, Gu X: “Depth profiling of degradation of multilayer photovoltaic backsheets after accelerated laboratory weathering: Cross-sectional Raman imaging”. Solar Energy Materials & Solar Cells 144: 289-299, 2016

 

key words
Polymers; Atomic force microscopy; Scanning electron microscopy: Raman microscope; Infrared microscope; Degradation; Photovoltaic; Service life; Energy;

Eligibility

Citizenship:  Open to U.S. citizens
Level:  Open to Postdoctoral applicants

Stipend

Base Stipend Travel Allotment Supplementation
$82,764.00 $3,000.00
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