RAP opportunity at National Institute of Standards and Technology NIST
Quantitative Aerosol Metrology for Nanoplastic and Semiconductor Applications
Location
Material Measurement Laboratory, Chemical Sciences Division
opportunity |
location |
|
50.64.61.C0519 |
Gaithersburg, MD |
NIST only participates in the February and August reviews.
Advisers
name |
email |
phone |
|
James Gregory Radney |
jimmy.radney@nist.gov |
301 975 3904 |
Description
Research is ongoing in the Chemical Sciences Division in the Material Measurement Laboratory of the National Institute of Standards and Technology to develop and improve quantitative measurements of size and mass of nanoparticles (aerosols) in various process systems.
Projects at NIST are laboratory-based with an emphasis on metrology. Examples include: 1) Using measurements and numerical simulations to better understand the transfer function and parameter space of aerosol instrumentation to reduce errors and uncertainties in measured values. 2) Measurements and models of aerosol dynamics to understand the interaction of particles with 3-dimensional interfaces under various flow conditions. 3) Metrology development for the detection of nano-plastics from various sources under different environmental conditions. 4) Metrology development for the detection, quantification and sizing of particle precursors and sub-20 nm native particles for ultrapure water and semiconductor applications. 5) Metrology development for the quantitative determination of the efficiency of ultrafiltration elements in process streams under various conditions.
key words
Aerosols; Nanomaterials; Nanoparticles; Metrology; Instrumentation; Spectroscopy; Nanoplastic; Semiconductor; Ultrapure water;
Eligibility
Citizenship:
Open to U.S. citizens
Level:
Open to Postdoctoral applicants
Stipend
Base Stipend |
Travel Allotment |
Supplementation |
|
$82,764.00 |
$3,000.00 |
|
|